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Amorphous Silicon under electron impact: in-bulk electron-hole pair formation, and secondary electron emission (SEE)
read2 Replies 279 ViewsVersion 5.3 Low-Frequency ElectromagneticsCharged Particle TracingPlasma Physics
Jonathan Thomet posted 7 years ago reply 7 years ago by Jonathan Thomet
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0 Replies 208 Views
Version 5.3 ElectromagneticsCharged Particle TracingSemiconductor Devices
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0 Replies 84 Views
Version 5.3a MEMS & NanotechnologyMEMS & Piezoelectric DevicesStructural Mechanics
Nabeel Khan posted 7 years ago
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2 Replies 241 Views
Version 5.3a Structural & AcousticsGeometryStructural Mechanics
Rishav Aryal posted 7 years ago reply 7 years ago by Rishav Aryal
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0 Replies 116 Views
General
Lauren Sansone posted 7 years ago
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0 Replies 141 Views
Version 5.3a ChemicalBattery DesignParameters, Variables, & Functions
Daniel Schanbacher posted 7 years ago
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0 Replies 383 Views
Version 5.2a GeneralHPC & Cloud Computing
Aditya Saurabh posted 7 years ago
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2 Replies 214 Views
Vartika Parihar posted 7 years ago reply 7 years ago by Sohan Birla
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Accessing Uplus and Yplus values and also determining Wall shear stress value in a turbulent channel flow.
read0 Replies 693 ViewsVersion 5.0 Computational Fluid Dynamics (CFD)
Lakshmi Narasiman Vijayasarathi posted 7 years ago
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1 Replies 431 Views
Shantharama Bhat posted 7 years ago reply 7 years ago by Mickaël Barsive
