Charged Particle Tracing Articles de Blog
Modeling a Pierce Electron Gun in COMSOL Multiphysics®
Cathode ray tubes, electron microscopes, spectrometers, and particle accelerators: These devices and components commonly use Pierce electron guns.
Computational Electromagnetics Modeling: Which Module to Use?
If you work with a particular electromagnetic device or application area, you might be wondering which module in the COMSOL product suite is right for you. Keep reading for a comprehensive intro.
Efficiently Analyze Charge Exchange Cell Designs Using Applications
Due to their neutral ion beam, charge exchange cells are used in processes ranging from ion implantation and semiconductor fabrication to synchrotron devices and medical research.
Protecting Aerospace Devices via an Ion-Material Interaction Benchmark
In outer space and other harsh radiation environments, high-energy ions and protons pierce materials and affect nearby electronic systems. Known as a single-event effect (SEE), the particle radiation can lead to soft or hard errors in devices. Since just one hard error puts a space mission at risk, aerospace engineers must make sure that all critical electronic devices can withstand an SEE. To gain a better understanding of this phenomenon, they can accurately analyze the ion-material interaction using simulation.
Optimizing Combustion Particle Control in an Electric Filter Design
To optimize the design of an electrostatic filter, researchers from Switzerland used multiphysics modeling, validating their results by comparing them to experimental data.
Studying the Van Allen Belts with Particle Tracing Simulation
Get a closer view of the Van Allen belts, 2 donut-shaped belts of radiation that surround Earth, with the help of particle tracing software.
Analyzing an Electrodynamic Ion Funnel with COMSOL Multiphysics®
Quadrupole mass filters and ion mobility spectrometers are used to detect explosives, study complex biological molecules, and more. Ion funnels are an important component of these devices.
Focusing on Einzel Lenses with Particle Tracing Simulation
You can use electrostatics analysis and charged particle tracing to better understand einzel lens systems and optimize their designs.
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