Magnetic Lens

Application ID: 10185

A scanning electron microscope samples images by scanning a target with a high-energy beam of electrons. The subsequent electron interactions produce signals such as secondary and back-scattered electrons that contain information about the sample surface topography. Electromagnetic lenses are used to focus this electron beam down to a spot about 10 nm wide on the sample surface.

This model requires both the Particle Tracing Module and the AC/DC Module.

This model is included as an example in the following products:

AC/DC Module Particle Tracing Module